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The optical signature of few-layer ReSe2

Łucja Kipczak, Magdalena Grzeszczyk, Katarzyna Olkowska‐Pucko, A. Babiński, Maciej R. Molas

2020Journal of Applied Physics30 citationsDOIOpen Access PDF

Abstract

Optical properties of thin layers of rhenium diselenide (ReSe2) with thicknesses ranging from mono- (1 ML) to nona-layer (9 MLs) are demonstrated. The photoluminescence (PL) and Raman scattering were measured at low (T=5K) and room (T=300K) temperature, respectively. The PL spectra of ReSe2 layers display two well-resolved emission lines, which blueshift by about 120 meV when the layer thickness decreases from 9 MLs to a monolayer. A rich structure of the observed low-energy Raman scattering modes can be explained within a linear chain model. The two phonon modes of intralayer vibrations, observed in Raman scattering spectra at about 120cm−1, exhibit very sensitive and opposite evolution as a function of layer thickness. It is shown that their energy difference can serve as a convenient and reliable tool to determine the thickness of ReSe2 flakes in the few-layer limit.

Topics & Concepts

Raman spectroscopyRaman scatteringPhotoluminescenceMonolayerPhononLayer (electronics)BlueshiftMaterials scienceDiselenideSpectral lineScatteringMolecular physicsRheniumAnalytical Chemistry (journal)ChemistryOpticsCondensed matter physicsOptoelectronicsNanotechnologyPhysicsMetallurgyAstronomySeleniumChromatography2D Materials and ApplicationsChalcogenide Semiconductor Thin FilmsPerovskite Materials and Applications
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