Evaluation of the Transfer Learning Models in Wafer Defects Classification
Jessnor Arif Mat Jizat, Anwar P. P. Abdul Majeed, Ahmad Fakhri Ab. Nasir, Zahari Taha, Edmund Yuen, Shi Xuen Lim
Topics & Concepts
WaferTransfer of learningMaterials scienceComputer scienceArtificial intelligenceNanotechnologyIndustrial Vision Systems and Defect DetectionAdvancements in Photolithography TechniquesNon-Destructive Testing Techniques