Candidate test set reduction for adaptive random testing: An overheads reduction technique
Rubing Huang, Haibo Chen, Weifeng Sun, Dave Towey
Topics & Concepts
Computer scienceRandom testingReduction (mathematics)Set (abstract data type)Test setCost reductionTest (biology)Reliability engineeringTest caseAlgorithmArtificial intelligenceMachine learningMathematicsEngineeringRegression analysisProgramming languageEconomicsBiologyPaleontologyGeometryManagementSoftware Testing and Debugging TechniquesVLSI and Analog Circuit TestingSoftware Reliability and Analysis Research