<i>In situ</i> AP-XPS analysis of a Pt thin-film sensor for highly sensitive H<sub>2</sub> detection
Ryo Toyoshima, Takahisa Tanaka, Taro Kato, Ken Uchida, Hiroshi Kondoh
Abstract
In situ ambient-pressure X-ray photoelectron spectroscopy (AP-XPS) combined with resistivity measurement was performed for a Pt thin-film H2 gas sensor. We experimentally demonstrate that the chemical state of the Pt surface changes under working conditions, and it directly links to the sensing performance. Moreover, the operating principle is discussed at the atomic scale.
Topics & Concepts
X-ray photoelectron spectroscopyThin filmIn situAnalytical Chemistry (journal)Materials scienceChemical stateAmbient pressureElectrical resistivity and conductivityChemistryNanotechnologyElectrical engineeringNuclear magnetic resonancePhysicsEnvironmental chemistryThermodynamicsEngineeringOrganic chemistryGas Sensing Nanomaterials and SensorsAnalytical Chemistry and SensorsElectrochemical Analysis and Applications