Comparative analysis of Schottky barriers for heterogeneous defect domains in monolayer WS2 field-effect transistors
Jungchun Kim, Gwang Hwi An, Seain Bang, Dong Geun Park, Donghyun Kim, Seunghee Jin, Min Jung Kim, Hyun Seok Lee, Jae Wook Lee
Topics & Concepts
Materials scienceSchottky barrierOhmic contactVacancy defectDopingField-effect transistorCondensed matter physicsMonolayerOptoelectronicsSemiconductorTransistorNanotechnologyDiodePhysicsLayer (electronics)VoltageQuantum mechanics2D Materials and ApplicationsMXene and MAX Phase MaterialsGraphene research and applications