EIS comparative study and critical Equivalent Electrical Circuit (EEC) analysis of the native oxide layer of additive manufactured and wrought 316L stainless steel
Reynier I. Revilla, Benny Wouters, Francesco Andreatta, Alex Lanzutti, L. Fedrizzi, Iris De Graeve
Topics & Concepts
Materials scienceDielectric spectroscopyCorrosionOxideX-ray photoelectron spectroscopyEquivalent circuitLayer (electronics)MetallurgyDielectricElectrical impedanceComposite materialElectrochemistryElectrodeChemical engineeringElectrical engineeringOptoelectronicsVoltageChemistryEngineeringPhysical chemistryAdditive Manufacturing Materials and ProcessesWelding Techniques and Residual StressesHigh-Temperature Coating Behaviors