Electronic properties of ionizing radiation-induced defects at SiO$$_2$$/Si interface associated with non-trivial excess current splitting
Binghuang Duan, Cen Xiong, Hang Zhou, Guanghui Zhang, Wu Zhang, Chao Zeng, Yu Song, Yang Liu
Topics & Concepts
SigmaIonizing radiationIrradiationRadiationAcceptorAtomic physicsElectronMaterials scienceCurrent (fluid)Fermi levelMolecular physicsPhysicsCondensed matter physicsOpticsNuclear physicsQuantum mechanicsThermodynamicsSemiconductor materials and devicesRadiation Effects in ElectronicsAdvancements in Semiconductor Devices and Circuit Design