Metasurface enabled quantum edge detection
Junxiao Zhou, Shi-Kai Liu, Haoliang Qian, Yin‐Hai Li, Hailu Luo, Shuangchun Wen, Zhi‐Yuan Zhou, Guang‐Can Guo, Bao-Sen Shi, Zhaowei Liu
Abstract
Metasurfaces consisting of engineered dielectric or metallic structures provide unique solutions to realize exotic phenomena including negative refraction, achromatic focusing, electromagnetic cloaking, and so on. The intersection of metasurface and quantum optics may lead to new opportunities but is much less explored. Here, we propose and experimentally demonstrate that a polarization-entangled photon source can be used to switch ON or OFF the optical edge detection mode in an imaging system based on a high-efficiency dielectric metasurface. This experiment enriches both fields of metasurface and quantum optics, representing a promising direction toward quantum edge detection and image processing with remarkable signal-to-noise ratio.