A robust multi-bit soft-error immune SRAM cell for low-power applications
Erfan Abbasian, Sobhan Sofimowloodi
Topics & Concepts
Static random-access memoryComputer scienceTransistorDissipationCacheVoltageSoft errorElectronic engineeringElectrical engineeringComputer hardwareEngineeringParallel computingPhysicsThermodynamicsLow-power high-performance VLSI designSemiconductor materials and devicesRadiation Effects in Electronics