Blue Persistent Phosphor of YSiO<sub>2</sub>N:Ce<sup>3+</sup> Developed by Codoping Sm<sup>3+</sup> or Tm<sup>3+</sup> Ions and Thermoluminescence Analysis of Their Trap Distributions
Yuuki Kitagawa, Jumpei Ueda, Setsuhisa Tanabe
Abstract
By estimating the trap depth from the relative position of the zigzag curve of divalent lanthanoid ions and conduction band bottom, the YSiO 2 N:Ce 3+ ‐based blue persistent phosphors are developed, and their persistent luminescence and thermoluminescence properties are characterized to identify the electron trap distributions. Taking the nephelauxetic effect caused by covalent nitrogen into account for the vacuum referred binding energy diagram, it is predicted that Tm 3+ and Sm 3+ ions with the trap depth of 0.726 and 1.04 eV are an optimal codopant to obtain Ce 3+ persistent luminescence. The prepared YSiO 2 N:Ce 3+ ‐Ln 3+ (Ln = Sm or Tm) samples enhance the Ce 3+ : 5 d → 4 f blue persistent luminescence intensity. In the thermoluminescence glow curves, the Ce 3+ singly doped sample shows two glow peaks related to intrinsic defects; on the other hand, the Ln 3+ codoped samples show an additional glow peak related to the Ln 3+ traps. The thermoluminescence glow curve analyses through the initial rise method combined with the thermal cleaning and trap density methods reveal that the electron traps of Ln 3+ ‐related defects have a distribution with ≈0.25 eV width and depths of 0.802 eV (Tm 3+ ) and 1.10 eV (Sm 3+ ).