Industrial process fault detection based on deep highly-sensitive feature capture
Bowen Liu, Yi Chai, Yuhu Liu, Chenghong Huang, Yiming Wang, Qiu Tang
Topics & Concepts
Fault detection and isolationArtificial intelligenceDeep learningFault (geology)Pattern recognition (psychology)Computer scienceFeature (linguistics)Feature extractionNoise (video)Deep belief networkEuclidean distanceProcess (computing)Field (mathematics)MathematicsImage (mathematics)ActuatorSeismologyGeologyOperating systemLinguisticsPure mathematicsPhilosophyFault Detection and Control SystemsMineral Processing and GrindingMachine Fault Diagnosis Techniques