Nonparametric Bayesian reliability analysis of masked data with dependent competing risks
Bin Liu, Yimin Shi, Hon Keung Tony Ng, Xiangwen Shang
Topics & Concepts
Nonparametric statisticsEstimatorBayesian probabilityCopula (linguistics)Multivariate statisticsCensoring (clinical trials)Bivariate analysisReliability (semiconductor)MathematicsEconometricsComputer scienceStatisticsPower (physics)Quantum mechanicsPhysicsStatistical Distribution Estimation and ApplicationsProbabilistic and Robust Engineering DesignStatistical Methods and Inference