Litcius/Paper detail

Numerical investigation of particle effect on wear characteristic of centrifugal slurry pump based on CFD-DEM coupling

Xiuwei Shi, Wujian Ding, Chunjie Xu, Fangwei Xie, Zuzhi Tian

2023Engineering Computations12 citationsDOI

Abstract

Purpose In the process of conveying the solid–liquid two-phase medium of the centrifugal slurry pump, the wear of the flow-passing parts is an important problem affecting its life and safe operation. Therefore, a numerical investigation on the wear characteristics of the centrifugal slurry pump under different particle conditions was conducted. Design/methodology/approach A solid-liquid two-phase model based on CFD-DEM coupling is established and used to analyze the flow field and the wear characteristics of the flow-passing parts with different particle densities, volume fractions and sizes. Findings Particle conditions will affect the pump flow field. To analyze the pump wear characteristics, the wear distribution, wear value and cumulative force laws of flow-passing parts under different particle conditions are obtained. In each flow-passing part, with the increase of particle density, volume fraction and size, the wear area is concentrated and the wear depth increases. Under different particle conditions, the wear is mainly on the volute chamber and the blade pressure surface, and the tangential cumulative force of flow-passing parts is much larger than the normal cumulative force. Originality/value An accurate model and a coupled simulation method for predicting the wear of the slurry pump are obtained, and the wear characteristic law can provide a reference for the design of the slurry pump to reduce friction.

Topics & Concepts

VoluteSlurryMechanicsMaterials scienceCentrifugal pumpComputational fluid dynamicsFlow (mathematics)Particle (ecology)ImpellerCFD-DEMCoupling (piping)Volume fractionMechanical engineeringEngineeringComposite materialPhysicsGeologyOceanographyErosion and Abrasive MachiningGranular flow and fluidized bedsTunneling and Rock Mechanics