Significance of activation functions in developing an online classifier for semiconductor defect detection
Md Meftahul Ferdaus, Bangjian Zhou, Ji Wei Yoon, Kain Lu Low, Jieming Pan, Joydeep Ghosh, Min Wu, Xiaoli Li, Aaron Thean, J. Senthilnath
Topics & Concepts
Computer scienceTransistorArtificial intelligenceArtificial neural networkSemiconductorClassifier (UML)Semiconductor deviceMachine learningFuzzy logicField (mathematics)Anomaly detectionElectronic engineeringElectrical engineeringMaterials scienceEngineeringVoltageNanotechnologyMathematicsLayer (electronics)Pure mathematicsData Stream Mining TechniquesAnomaly Detection Techniques and ApplicationsMachine Learning and Data Classification