Ranked Feature-Based Laser Material Processing Monitoring and Defect Diagnosis Using k-NN and SVM
Seung Hwan Lee, J. Mazumder, Jaewoong Park, Seokgoo Kim
Topics & Concepts
Materials scienceFeature (linguistics)Support vector machinePattern recognition (psychology)LaserArtificial intelligenceMaterials processingProcess engineeringOpticsComputer scienceEngineeringPhysicsLinguisticsPhilosophyIndustrial Vision Systems and Defect DetectionWelding Techniques and Residual StressesAdditive Manufacturing Materials and Processes