Accurate measurement of strain at interfaces in 4D-STEM: A comparison of various methods
Christoph Mahr, Knut Müller‐Caspary, Tim Grieb, Florian F. Krause, Marco Schowalter, Andreas Rosenauer
Topics & Concepts
DiffractionOpticsElectron diffractionPtychographyAperture (computer memory)MicrobeamMaterials scienceCondenser (optics)MicroscopePhysicsAcousticsLight sourceAdvanced Electron Microscopy Techniques and ApplicationsAdvanced X-ray Imaging TechniquesElectron and X-Ray Spectroscopy Techniques