UV degradation of the interface between perovskites and the electron transport layer
Ranran Liu, Li Wang, Yingping Fan, Zhipeng Li, Shuping Pang
Abstract
and more seriously, the formed hole structure significantly limits the carrier injection at the interface owing to the separation of the perovskite active layer from ETLs. Under the same conditions, the perovskite/PCBM interface is very stable and maintains a highly efficient carrier injection. There is no significant efficiency degradation of the encapsulated PCBM-based devices measured outdoors for about three months.
Topics & Concepts
Degradation (telecommunications)Layer (electronics)Interface (matter)ElectronMaterials scienceElectron transport chainChemical engineeringEngineering physicsOptoelectronicsNanotechnologyChemical physicsChemistryComputer scienceComposite materialPhysicsEngineeringTelecommunicationsBiochemistryQuantum mechanicsCapillary actionCapillary numberPerovskite Materials and ApplicationsElectronic and Structural Properties of OxidesZnO doping and properties