Litcius/Paper detail

Characterization of plastic and creep behavior in thick aluminum wire for power modules

Nobuyuki SHISHIDO, Yoshiki Setoguchi, Yuto Kumagai, Masaaki KOGANEMARU, Tōru IKEDA, Yutaka HAYAMA, Noriyuki MIYAZAKI

2021Microelectronics Reliability11 citationsDOI

Topics & Concepts

Materials scienceCreepWire bondingConstitutive equationStructural engineeringStress (linguistics)Isothermal processAluminiumDisplacement (psychology)Composite materialReliability (semiconductor)Strain energy density functionFracture (geology)Finite element methodPower (physics)EngineeringThermodynamicsElectrical engineeringChipPhysicsPsychotherapistPhilosophyPsychologyLinguisticsSilicon Carbide Semiconductor TechnologiesElectronic Packaging and Soldering TechnologiesAluminum Alloys Composites Properties