Litcius/Paper detail

Fatigue-induced dynamic pull-in instability in electrically actuated microbeam resonators

Shun Zhang, Jin Zhang

2021International Journal of Mechanical Sciences14 citationsDOI

Topics & Concepts

MicrobeamMicroelectromechanical systemsResonatorCoalescence (physics)Materials scienceInstabilityMechanicsStructural engineeringOptoelectronicsOpticsEngineeringPhysicsAstrobiologyAdvanced MEMS and NEMS TechnologiesMechanical and Optical ResonatorsForce Microscopy Techniques and Applications
Fatigue-induced dynamic pull-in instability in electrically actuated microbeam resonators | Litcius