Bandgap Shrinkage and Charge Transfer in 2D Layered SnS<sub>2</sub> Doped with V for Photocatalytic Efficiency Improvement
A.R. Shelke, Hsiao‐Tsu Wang, J. W. Chiou, Indrajit Shown, Amr Sabbah, Kuang‐Hung Chen, Shu‐Ang Teng, I‐An Lin, Chi‐Cheng Lee, Hung‐Chung Hsueh, Yu‐Hui Liang, Chao‐Hung Du, Priyanka L. Yadav, Sekhar C. Ray, Shang‐Hsien Hsieh, Chih‐Wen Pao, Huang‐Ming Tsai, Chia‐Hao Chen, Kuei‐Hsien Chen, Li–Chyong Chen, W. F. Pong
Abstract
Abstract Effects of electronic and atomic structures of V‐doped 2D layered SnS 2 are studied using X‐ray spectroscopy for the development of photocatalytic/photovoltaic applications. Extended X‐ray absorption fine structure measurements at V K ‐edge reveal the presence of VO and VS bonds which form the intercalation of tetrahedral OVS sites in the van der Waals (vdW) gap of SnS 2 layers. X‐ray absorption near‐edge structure (XANES) reveals not only valence state of V dopant in SnS 2 is ≈4 + but also the charge transfer (CT) from V to ligands, supported by V L α,β resonant inelastic X‐ray scattering. These results suggest V doping produces extra interlayer covalent interactions and additional conducting channels, which increase the electronic conductivity and CT. This gives rapid transport of photo‐excited electrons and effective carrier separation in layered SnS 2 . Additionally, valence‐band photoemission spectra and S K ‐edge XANES indicate that the density of states near/at valence‐band maximum is shifted to lower binding energy in V‐doped SnS 2 compare to pristine SnS 2 and exhibits band gap shrinkage. These findings support first‐principles density functional theory calculations of the interstitially tetrahedral OVS site intercalated in the vdW gap, highlighting the CT from V to ligands in V‐doped SnS 2 .