RESULTS OF RELIABILITY EVALUATION OF THE 1921VK035 CHIP
Vladimir Zolnikov, Светлана Евдокимова, Ekaterina Grosheva, A. Yankov
Abstract
The article considers a model for evaluating the reliability of integrated circuits (IC) depending on the temperature of the crystal and the environment. The calculation and experimental prediction of the reliability of the 1921VK035 chips was carried out, the dependences of the minimum time to failure of the product on the temperature of the 1921VK035 IC crystal and the gamma-percent life of the IC on the ambient temperature were obtained. The obtained values of these chip parameters meet the requirements of ISO 11 0998-99.
Topics & Concepts
Reliability (semiconductor)ChipReliability engineeringIntegrated circuitCrystal (programming language)Product (mathematics)Materials scienceComputer scienceEngineeringElectrical engineeringOptoelectronicsMathematicsThermodynamicsPhysicsPower (physics)Programming languageGeometryAerospace, Electronics, Mathematical ModelingEngineering Diagnostics and ReliabilityTechnology Assessment and Management