Identification of Unsound Grains in Wheat Using Deep Learning and Terahertz Spectral Imaging Technology
Yuying Jiang, Fei Wang, Hongyi Ge, Guangming Li, Xinyu Chen, Li Li, Ming Lv, Yuan Zhang
Abstract
This paper offers a prospective solution to the poor quality and less prominent features of the original terahertz spectral images of unsound wheat grains caused due to the imaging system and background noise. In this paper, a CBDNet-V terahertz spectral image enhancement model is proposed. Compared with the traditional algorithms, the peak signal-to-noise ratio (PSNR) and structural similarity (SSIM) of the obtained enhanced images using the proposed model show performance improvement. As validated by the ResNet-50 classification network, the proposed model processes images with an accuracy of 94.8%, and the recognition accuracy is improved by 3.7% and 1.9%, respectively, compared to the images with only denoising and feature extraction. The experimental results indicate that the deep learning-based terahertz spectral image technology for unsound wheat kernels has good prospects in the identification of unsound wheat kernels.