A Density Metric for Semiconductor Technology [Point of View]
H.‐S. Philip Wong, Kerem Akarvardar, D.A. Antoniadis, Jeffrey Bokor, Chenming Hu, Tsu-Jae King-Liu, Subhasish Mitra, J.D. Plummer, Sayeef Salahuddin
Abstract
Since its inception, the semiconductor industry has used a physical dimension (the minimum gate length of a transistor) as a means to gauge continuous technology advancement. This metric is all but obsolete today. As a replacement, we propose a density metric, which aims to capture how advances in semiconductor device technologies enable system-level benefits. The proposed metric can be used to gauge advances in future generations of semi-conductor technologies in a holistic way, by accounting for the progress in logic, memory, and packaging/integration technologies simultaneously.
Topics & Concepts
Metric (unit)TransistorDimension (graph theory)SemiconductorGauge (firearms)Point (geometry)Computer scienceIndustrial engineeringElectrical engineeringEngineeringMathematicsOperations managementMaterials scienceVoltagePure mathematicsGeometryMetallurgySemiconductor materials and devicesFerroelectric and Negative Capacitance DevicesAdvancements in Semiconductor Devices and Circuit Design