Advanced XPS characterization: XPS-based multi-technique analyses for comprehensive understanding of functional materials
Mark A. Isaacs, Josh Davies-Jones, Philip R. Davies, Shaoliang Guan, Roxy Lee, David Morgan, Robert G. Palgrave
Abstract
X-ray photoelectron spectroscopy (XPS) has achieved maturity as an analytical technique in the materials community, however as made apparent by recent reviews highlighting it's misuse, it is a practice which is often misunderstood.
Topics & Concepts
X-ray photoelectron spectroscopyCharacterization (materials science)Maturity (psychological)Materials scienceNanotechnologyAnalytical Chemistry (journal)Chemical engineeringChemistryEnvironmental chemistryPsychologyEngineeringDevelopmental psychologyElectron and X-Ray Spectroscopy TechniquesElectronic and Structural Properties of OxidesAdvanced Photocatalysis Techniques