Tandem Probe Analysis Mode for Synchrotron XFM: Doubling Throughput Capacity
Casey L. Doolette, Daryl L. Howard, Nader Afshar, Cameron M. Kewish, David Paterson, Jianyin Huang, Stefan Wagner, Jakob Santner, Walter W. Wenzel, Tom Raimondo, Alexander T. De Vries Van Leeuwen, Lei Hou, Frederik van der Bom, Zhe Weng, Peter M. Kopittke, Enzo Lombi
Abstract
-acrylamide, polyacrylamide, and polyurethane), polyurethane gels were most suitable for XFM analysis, having favorable handling, drying, and analytical properties. This gel type enabled quantitative (>99%) transmittance with minimal (<3%) flux variation during raster scanning, whereas the other gels had a substantial effect on the beam focus. For the first time, we have (1) used XFM for mapping analytes in large DGTs and (2) developed a tandem probe analysis mode for synchrotron-based XFM, effectively doubling throughput. The novel tandem probe analysis mode described here is of broad applicability across many XFM beamlines as it could be used for future experiments where any uniform, highly transmissive sample could be analyzed upstream in the "background" of downstream samples.