Litcius/Paper detail

Positive and negative charge trapping GaN HEMTs: Interplay between thermal emission and transport-limited processes

A. Nardo, Carlo De Santi, Christian Koller, Clemens Ostermaier, I. Daumiller, Gaudenzio Meneghesso, Enrico Zanoni, Matteo Meneghini

2021Microelectronics Reliability28 citationsDOIOpen Access PDF

Topics & Concepts

TrappingCharge (physics)Activation energyThermal conductionMaterials scienceThermalAtomic physicsChemistryChemical physicsMolecular physicsAnalytical Chemistry (journal)OptoelectronicsPhysicsThermodynamicsBiologyChromatographyQuantum mechanicsOrganic chemistryEcologyComposite materialGaN-based semiconductor devices and materialsSemiconductor materials and devicesGa2O3 and related materials