A systematic influence of Cu doping on structural and opto-electrical properties of fabricated Yb2O3 thin films for Al/Cu-Yb2O3/p-Si Schottky diode applications
K.S. Mohan, A. Panneerselvam, R. Marnadu, J. Chandrasekaran, Mohd. Shkir, A. Tataroğlu
Topics & Concepts
Materials scienceCrystalliteBand gapDopingField emission microscopyThin filmSchottky diodeAnalytical Chemistry (journal)Scanning electron microscopeEnergy-dispersive X-ray spectroscopyOptoelectronicsNanotechnologyDiodeDiffractionMetallurgyComposite materialOpticsChemistryPhysicsChromatographySemiconductor materials and interfacesSilicon Carbide Semiconductor TechnologiesCopper Interconnects and Reliability