Cryogenic Focused Ion Beam Enables Atomic-Resolution Imaging of Local Structures in Highly Sensitive Bulk Crystals and Devices
Jinfei Zhou, Nini Wei, Daliang Zhang, Yujiao Wang, Jingwei Li, Xiaopeng Zheng, Jianjian Wang, Abdullah Y. Alsalloum, Lingmei Liu, Osman M. Bakr, Yu Han
Abstract
structure and locate its distribution in a single-crystal film perovskite solar cell. This proof-of-concept study demonstrates that cryo-FIB has a unique ability to handle highly sensitive materials, which can substantially expand the range of applications for electron microscopy.
Topics & Concepts
Focused ion beamTransmission electron microscopyNanotechnologyChemistryNanomaterialsResolution (logic)Ion beamPerovskite (structure)IonMaterials scienceCrystallographyArtificial intelligenceOrganic chemistryComputer sciencePerovskite Materials and ApplicationsGa2O3 and related materialsHigh-pressure geophysics and materials