Intelligent detection technology of flip chip based on H-SVM algorithm
Yuhua Sha, Zhenzhi He, Jiawei Du, Zheyingzi Zhu, Xiangning Lu
Topics & Concepts
Support vector machineFlip chipHistogramMicroelectronicsReliability (semiconductor)AlgorithmArtificial intelligenceFeature (linguistics)Computer scienceVariable (mathematics)Feature extractionChipPattern recognition (psychology)EngineeringImage (mathematics)MathematicsMaterials scienceNanotechnologyLayer (electronics)TelecommunicationsPhilosophyMathematical analysisElectrical engineeringPhysicsPower (physics)Quantum mechanicsLinguisticsAdhesiveIndustrial Vision Systems and Defect DetectionImage Processing Techniques and ApplicationsIntegrated Circuits and Semiconductor Failure Analysis