Litcius/Paper detail

First Demonstration of an N-Polar InAlGaN/GaN HEMT

Robert Hamwey, Nirupam Hatui, Emre Akso, Feng Wu, Christopher Clymore, S. Keller, James S. Speck, Umesh K. Mishra

2024IEEE Electron Device Letters12 citationsDOI

Abstract

In this letter, we report the first N-polar InAlGaN quaternary back barrier high-electron-mobility transistor (HEMT). The epitaxial device heterostructure was grown by metal organic chemical vapor deposition (MOCVD). Hall measurements of the heterostructure showed a two-dimensional electron gas (2DEG) density of <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$2.85\times 10^{{13}}$ </tex-math></inline-formula> cm <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$^{-{2}}$ </tex-math></inline-formula> and a mobility of 1048 cm <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$^{{2}}\,\,\text{s}^{-{1}}\,\,\text{V}^{-{1}}$ </tex-math></inline-formula> . Transfer length method measurements showed a remarkably low sheet resistance of <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$179~\Omega /\Box $ </tex-math></inline-formula> in the source-drain direction. A HEMT with a gate length of <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$0.6~\mu \text{m}$ </tex-math></inline-formula> and source-drain spacing of <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$3.1~\mu \text{m}$ </tex-math></inline-formula> showed a peak transconductance of 212 mS/mm and a high peak DC drain current of 1.92 A/mm. Small signal measurements of an equivalent HEMT yielded a current-gain cut-off frequency ( <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$\text{f}_{\text {T}}{)}$ </tex-math></inline-formula> and power-gain cut-off frequency ( <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$\text{f}_{\text {max}}{)}$ </tex-math></inline-formula> of 18 GHz and 28 GHz, respectively, at peak <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$\text{f}_{\text {max}}$ </tex-math></inline-formula> bias conditions (VGS = −9 V and VDS = 5 V).

Topics & Concepts

High-electron-mobility transistorOptoelectronicsWide-bandgap semiconductorGallium nitrideMaterials sciencePolarElectrical engineeringVoltageNanotechnologyTransistorPhysicsEngineeringAstronomyLayer (electronics)GaN-based semiconductor devices and materialsSemiconductor Quantum Structures and DevicesPhotocathodes and Microchannel Plates