Characterization of silver layers deposited by aluminum oxide, silicon dioxide, and blend for highly reflective optics
Hsing-Yu Wu, Hongwei Chen, Shaorong Huang, Chih-Hsuan Shih, Guoyu Yu, Yung-Shin Sun, Jin–Cherng Hsu
Topics & Concepts
X-ray photoelectron spectroscopyMaterials scienceAdhesionOxideSilver oxideLayer (electronics)Silicon dioxideSiliconAluminiumMetalInfraredNanotechnologyChemical engineeringOptoelectronicsOpticsComposite materialMetallurgyEngineeringPhysicsOptical Coatings and GratingsSurface Roughness and Optical MeasurementsThin-Film Transistor Technologies