Analog circuit fault diagnosis based on density peaks clustering and dynamic weight probabilistic neural network
Junyou Shi, Yi Deng, Zili Wang
Topics & Concepts
Cluster analysisPattern recognition (psychology)Computer scienceFault (geology)Artificial neural networkProbabilistic logicArtificial intelligenceProbabilistic neural networkData miningAlgorithmTime delay neural networkGeologySeismologyIntegrated Circuits and Semiconductor Failure AnalysisIndustrial Vision Systems and Defect DetectionVLSI and Analog Circuit Testing