A sensitivity-improved amplitude method for determining film thickness based on the partial reflection waves
Jianyun Wang, Yanbo He, Kun Shu, Chuanwei Zhang, Haide Yu, Le Gu, Tingjian Wang, Zhen Li, Liqin Wang
Topics & Concepts
AmplitudeReflection (computer programming)Reflection coefficientMaterials scienceOpticsRangingSensitivity (control systems)AcousticsRange (aeronautics)Composite materialPhysicsGeologyElectronic engineeringComputer scienceEngineeringGeodesyProgramming languageTribology and Lubrication EngineeringAdvanced Measurement and Metrology TechniquesGear and Bearing Dynamics Analysis