Stochastic degradation modeling and remaining useful lifetime prediction based on long short-term memory network
WANG Zezhou, Jian Hou, Zhu Jiantai, Wang Liyuan, Cai Zhongyi
Topics & Concepts
Term (time)Long short term memoryDegradation (telecommunications)Computer scienceReliability engineeringArtificial neural networkEngineeringArtificial intelligenceTelecommunicationsRecurrent neural networkPhysicsQuantum mechanicsReliability and Maintenance OptimizationMachine Fault Diagnosis TechniquesConcrete Corrosion and Durability