Soft Error Reliability Analysis of Vision Transformers
Xinghua Xue, Cheng Liu, Ying Wang, Yang Bing, Tao Luo, Lei Zhang, Huawei Li, Xiaowei Li
Abstract
Vision transformers (ViTs) that leverage self-attention mechanism have shown superior performance on many classical vision tasks compared to convolutional neural networks (CNNs) and gain increasing popularity recently. Existing ViTs’ works mainly optimize performance and accuracy, but ViTs’ reliability issues induced by soft errors in large-scale VLSI designs have generally been overlooked. In this work, we mainly study the reliability of ViTs and investigate the vulnerability from different architecture granularities ranging from models, layers, modules, and patches for the first time. The investigation reveals that ViTs with the self-attention mechanism are generally more resilient on linear computing including general matrix–matrix multiplication (GEMM) and full connection (FC) and show a relatively even vulnerability distribution across the patches. ViTs involve more fragile non-linear computing such as softmax and GELU compared to typical CNNs. With the above observations, we propose a lightweight block-wise algorithm-based fault-tolerance (LB-ABFT) approach to protect the linear computing implemented with distinct sizes of GEMM and apply a range-based protection scheme to mitigate soft errors in non-linear computing. According to our experiments, the proposed fault-tolerant approaches enhance ViTs’ accuracy significantly with minor computing overhead in the presence of various soft errors.