Quantitative <scp>X</scp>‐ray scattering and reflectivity measurements of polymer thin films with <scp>2D</scp> detectors
Mingqiu Hu, Xuchen Gan, Zhan Chen, Hong‐Gyu Seong, Todd Emrick, Thomas P. Russell
Abstract
Abstract We describe a fully open‐sourced Python package to process raw X‐ray scattering data using a GANESHA SAXSLAB facility, and review in this manuscript the connection of X‐ray scattering theories with the open‐sourced package. This package affords researchers more flexibility in analyzing and visualizing X‐ray scattering and reflectivity data from what is now a commonplace facility at many universities and research laboratories engaged in polymer research. We briefly review the applications of X‐ray scattering and diffraction, followed by the scattering theories. A pedagogical introduction to processing X‐ray scattering data is provided using the modules in the Python package. We compare conventions to visualize and interpret transmission and grazing‐incidence scattering data using self‐assembled lamellar morphology of bottlebrush copolymers as an example, then describe how area detectors measure specular and off‐specular reflectivity. Examples of in‐house reflectivity and grazing incidence scattering for the metrological examination of a grating are provided, where the full pitch and pitch height of a line pattern is measured easily without needing to simulate the full scattering intensity profile.