Reliability assessment for a k-out-of-n: F system supported by a multi-state protective device in a shock environment
Xian Zhao, Bingbing Dong, Xiaoyue Wang, Yanbo Song
Topics & Concepts
Reliability (semiconductor)Shock (circulatory)Reliability engineeringState (computer science)EngineeringComputer scienceStructural engineeringEnvironmental sciencePhysicsThermodynamicsMedicineAlgorithmPower (physics)Internal medicineReliability and Maintenance OptimizationRadiation Effects in ElectronicsAdvanced Battery Technologies Research