A simulation-based few samples learning method for surface defect segmentation
Taoran Wei, Danhua Cao, Caiyun Zheng, Qun Yang
Topics & Concepts
SegmentationComputer scienceArtificial intelligenceSurface (topology)Pattern recognition (psychology)Machine learningMaterials scienceMathematicsGeometryIndustrial Vision Systems and Defect DetectionSurface Roughness and Optical MeasurementsManufacturing Process and Optimization