Metrology of small particles and solute clusters by atom probe tomography
Frédéric De Geuser, Baptiste Gault
Topics & Concepts
Atom probeContext (archaeology)MetrologyMaterials scienceRADIUSParticle (ecology)Image resolutionRange (aeronautics)Resolution (logic)ScatteringComputational physicsNanometreNanotechnologyPhysicsOpticsComputer scienceComposite materialGeologyTransmission electron microscopyArtificial intelligenceComputer securityPaleontologyOceanographyBiologyAdvanced Materials Characterization TechniquesHydrogen embrittlement and corrosion behaviors in metalsDiamond and Carbon-based Materials Research