On frequency and voltage dependent physical characteristics and interface states characterization of the metal semiconductor (MS) structures with (Ti:DLC) interlayer
Ö. Berkün, Murat Ulusoy, Ş. Altındal, Barış Avar
Topics & Concepts
X-ray photoelectron spectroscopyMaterials scienceAnalytical Chemistry (journal)DopingAnnealing (glass)Fermi levelSemiconductorDielectric spectroscopyConductanceElectrochemistryCondensed matter physicsNuclear magnetic resonanceComposite materialPhysical chemistryElectronOptoelectronicsElectrodeChemistryPhysicsQuantum mechanicsChromatographySemiconductor materials and interfacesSemiconductor materials and devicesIntegrated Circuits and Semiconductor Failure Analysis