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Optical characteristics of Bi12SiO20 single crystals by spectroscopic ellipsometry

M. Isik, S. Delice, Hisham Nasser, N.M. Gasanly, N.H. Darvishov, V. E. Bagiev

2020Materials Science in Semiconductor Processing21 citationsDOIOpen Access PDF

Topics & Concepts

Materials scienceRefractive indexEllipsometryDielectricAttenuation coefficientLattice constantMolar absorptivityAnalytical Chemistry (journal)Absorption spectroscopyCrystal (programming language)Band gapSingle crystalAbsorption (acoustics)OpticsSpectral lineDiffractionMolecular physicsCrystallographyOptoelectronicsThin filmChemistryPhysicsNanotechnologyComputer scienceComposite materialProgramming languageChromatographyAstronomyPhotorefractive and Nonlinear OpticsGas Sensing Nanomaterials and SensorsAcoustic Wave Resonator Technologies
Optical characteristics of Bi12SiO20 single crystals by spectroscopic ellipsometry | Litcius