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Permittivity Measurement of the Dielectric Material at the Off-Axis Position in a Cylindrical Cavity

Chong Gao, En Li, Yunpeng Zhang, Yong Gao, Lin Huang

2021IEEE Transactions on Microwave Theory and Techniques14 citationsDOI

Abstract

In most measurement models of the cylindrical cavity, concentricity between the rod-like sample and cylindrical cavity is a basic premise of an accurate calculation model. Once a sample is randomly placed in the off-axis position in the sample hole of the cavity, the real will not conform to the established calculation model and the off-axis position should be taken into account to the measurement error. In this article, a measurement method to calculate permittivity of the sample placed at the off-axis position in the sample hole is presented. The actual location of the sample in a cylindrical cavity is first obtained in the application of vision measurement. Field distribution in the cavity is calculated by using the mode-matching method. The measured sample in the cavity is divided into finite small elements with arc shapes, and permittivity calculation expression is established by using the perturbation theory. A TM-mode cylindrical cavity that installed two miniature camera probes around the cavity wall is designed and used to measure permittivity of the material. Teflon and fused silica with different off-axis positions are measured and compared with the published results at several resonance frequencies. The maximum permittivity errors of Teflon and fused silica are 1.6% (at around 2 GHz) and 0.68% (at around 10.8 GHz), respectively. The maximum loss tanδ errors are 5.8e <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">-5</sup> (at around 12.5 GHz) and 1.44e <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">-4</sup> (at around 9.9 GHz), respectively.

Topics & Concepts

PermittivityOpticsPosition (finance)Microwave cavityCavity wallDielectricMaterials scienceSample (material)Relative permittivityPhysicsAcousticsMicrowaveOptoelectronicsQuantum mechanicsThermodynamicsEconomicsComposite materialFinanceMicrowave and Dielectric Measurement TechniquesElectromagnetic Compatibility and MeasurementsNon-Destructive Testing Techniques
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