Machine learning for analyzing atomic force microscopy (AFM) images generated from polymer blends
Aanish Paruchuri, Yunfei Wang, Xiaodan Gu, Arthi Jayaraman
Abstract
In this paper, we present a new machine learning (ML) workflow with unsupervised learning techniques to identify domains within atomic force microscopy (AFM) images obtained from polymer films.
Topics & Concepts
Atomic force microscopyMicroscopyMaterials sciencePolymerNanotechnologyComposite materialOpticsPhysicsForce Microscopy Techniques and ApplicationsMachine Learning in Materials ScienceNanofabrication and Lithography Techniques