Facile synthesis and characterization of TiO2 nanoparticles: X-ray peak profile analysis using Williamson–Hall and Debye–Scherrer methods
S. Mustapha, Jimoh Oladejo Tijani, M. M. Ndamitso, A. S. Abdulkareem, D. T. Shuaib, A.T. Amigun, Hauwa Lamino Abubakar
Topics & Concepts
Scherrer equationCharacterization (materials science)DebyeMaterials scienceNanoparticleDebye lengthHall effectCondensed matter physicsPhysicsAnalytical Chemistry (journal)NanotechnologyChemistryElectrical resistivity and conductivityQuantum mechanicsChromatographyElectronX-ray Diffraction in CrystallographyElectron and X-Ray Spectroscopy TechniquesCopper-based nanomaterials and applications