Topological event rates and the evolution of the grain face distribution in grain growth
Robert T. DeHoff, Burton R. Patterson
Topics & Concepts
Event (particle physics)Statistical physicsFace (sociological concept)Monte Carlo methodGrain growthDistribution (mathematics)Topology (electrical circuits)Grain sizeMaterials scienceMathematicsStatisticsPhysicsMathematical analysisCombinatoricsSociologyQuantum mechanicsSocial scienceMetallurgyTheoretical and Computational PhysicsStochastic processes and statistical mechanicsMaterial Dynamics and Properties