Towards a reliable assessment of charging effects during surface analysis: Accurate spectral shapes of ZrO2 and Pd/ZrO2 via X-ray Photoelectron Spectroscopy
Pascal Bargiela, Vincent Fernandez, Christophe Cardinaud, John Walton, Mark Greiner, David Morgan, Neal Fairley, Jonas Baltrušaitis
Topics & Concepts
X-ray photoelectron spectroscopyMaterials scienceSpectral lineWork (physics)ElectronBand gapBinding energyCompensation (psychology)OptoelectronicsAtomic physicsPhysicsNuclear magnetic resonanceAstronomyQuantum mechanicsThermodynamicsPsychoanalysisPsychologyElectron and X-Ray Spectroscopy TechniquesCatalytic Processes in Materials ScienceMachine Learning in Materials Science