Characterization of electro-optic coefficients r<sub>13</sub>, r<sub>23</sub> and r<sub>33</sub> in single crystalline BaTiO<sub>3</sub> thin films
Yu Cao, Nour Al Meselmene, El Hadj Dogheche, Ping Yang, Parikshit Moitra, Shiqiang Li, T. Venkatesan, Aaron J. Danner
Abstract
We report experimental characterization of DC electro-optic coefficients r 13 , r 23 and r 33 in thin film single crystalline BaTiO 3 on DyScO 3 . The epitaxial BaTiO 3 thin film is sandwiched between a SrRuO 3 bottom electrode and an indium tin oxide (ITO) top electrode. We characterize the DC electro-optic coefficients r 13 , r 23 , and r 33 by the prism coupling method at 636.6 nm for the BaTiO 3 thin film. The results show the DC coefficients r 13 = 4.2 pm/V, r 23 = 4.6 pm/V and r 33 = 9.0 pm/V.
Topics & Concepts
Materials scienceThin filmIndium tin oxideElectrodeCharacterization (materials science)IndiumPrismRefractive indexOpticsAnalytical Chemistry (journal)EpitaxyOptoelectronicsNanotechnologyPhysicsLayer (electronics)ChromatographyChemistryQuantum mechanicsPhotonic and Optical DevicesPhotorefractive and Nonlinear OpticsFerroelectric and Piezoelectric Materials