Efficient reliability analysis considering uncertainty in random field parameters: Trained neural networks as surrogate models
Xuzhen He, Fang Wang, Wengui Li, Daichao Sheng
Topics & Concepts
Reliability (semiconductor)Random fieldRandom variableMonte Carlo methodArtificial neural networkSurrogate modelField (mathematics)Sensitivity (control systems)Uncertainty analysisUncertainty quantificationComputer scienceAlgorithmEngineeringStatisticsMathematicsMachine learningPure mathematicsPower (physics)PhysicsQuantum mechanicsElectronic engineeringGeotechnical Engineering and AnalysisGeotechnical Engineering and Underground StructuresDam Engineering and Safety