Triplet-Polaron-Annihilation-Induced Degradation of Organic Light-Emitting Diodes Based on Thermally Activated Delayed Fluorescence
Bas van der Zee, Yungui Li, Gert‐Jan A. H. Wetzelaer, Paul W. M. Blom
Abstract
Organic light-emitting diodes (OLEDs) based on thermally activated delayed fluorescence (TADF) are alternatives to today's commercial phosphorescent OLEDs with heavy-metal dopants, but their limited stability remains a key issue. This work provides a quantitative insight into the degradation mechanisms. The authors reproduce the voltage and light output using a recently developed device model, and find that triplet-polaron annihilation is the driving force behind the formation of degradation traps. This understanding leads to the experimental demonstration of enhanced device lifetime, and will provide guidance towards improved stability of TADF OLEDs.
Topics & Concepts
OLEDPolaronMaterials sciencePhosphorescenceAnnihilationDiodeOptoelectronicsDegradation (telecommunications)DopantFluorescenceElectroluminescencePhotochemistryDopingNanotechnologyChemistryOpticsPhysicsComputer scienceElectronTelecommunicationsQuantum mechanicsLayer (electronics)Organic Light-Emitting Diodes ResearchOrganic Electronics and PhotovoltaicsThin-Film Transistor Technologies