Influence of lens aberrations, specimen thickness and tilt on differential phase contrast STEM images
Julius Bürger, Thomas Riedl, J.K.N. Lindner
Topics & Concepts
OpticsLens (geology)Tilt (camera)Materials scienceMicroscopeDetectorBeam (structure)Spherical aberrationScanning transmission electron microscopyElectron microscopePhysicsMechanical engineeringEngineeringElectron and X-Ray Spectroscopy TechniquesAdvanced Electron Microscopy Techniques and ApplicationsAdvanced X-ray Imaging Techniques